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About Match!
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Demo Version

If you are interested in evaluating MATCH!, you can download a time-limited demonstration version free-of-charge.
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Match! Function List

  • Fast single and multiple phase identification from powder diffraction data
  • Use the ICDD PDF-2 database (or PDF-4 with the upcoming version 1.2) and/or your own diffraction data or patterns calculated from crystal structure data (e.g. CIF files) in phase identification
  • Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
  • Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
  • Automatic residual searching with respect to identified phases
  • Automatic raw data processing: α2-stripping, background subtraction, peak search, error correction
  • Comfortable manual editing of peaks (add/shift/delete) using mouse or keyboard
  • Semi-quantitative analysis (Reference Intensity Ratio method)
  • Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
  • Integrated database retrieval system and viewer for PDF and user datasheets
  • Multiple step undo/redo
  • Support for new PDF entry numbers (9 digits)
  • User-configurable automatic operation
  • Full parameter control with instant rearrangement of the results list
  • Automatic d-value shifting during search-match process (optionally)
  • Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
  • Comfortable graphical and tabular comparison of peak data and candidate patterns
  • Mouse-controlled pattern graphics zooming and tracking
  • User-configurable HTML-reports
  • Supported diffraction data file formats: Stoe (*.raw, *.pks), Philips/ PANalytical (*.rd, *.udf, *.udi), Bruker/Siemens V3 (*.raw), Siemens (*.uxd), DBWS (*.rfl, *.dat), ASCII profile (start, step, intensities or 2 columns), ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)

System requirements

  • Personal Computer with Microsoft Windows 98, ME, NT 4.0, 2000 or XP operating system
  • Reference pattern database (ICDD PDF-2 or PDF-4 (with version 1.2) (recommended)) and/or own powder diffraction patterns or crystal structure data (e.g. CIF files))
  • Microsoft Internet Explorer 5.01 or higher
  • 64 megabytes of RAM (128 megabytes recommended)
  • Hard disk with minimum 100 megabytes of free disk space
  • Graphics resolution of 1024 x 768 pixels with 32,768 colors ("High Color")