Version 2: The best Match! you have ever seen!

For the first time in the history of Crystal Impact, the next version of Match! will not only run on Windows but also natively on Mac OS X and Linux. The new version 2 of the software is currently available free-of-charge as a time-limited beta-version. If you are interested in the development progress, you might want to take a look at my corresponding blog.

As you see, the user interface has been completely revised: It now provides an intuitive and instant usage of restraints and additional information (on the upper right-hand side), as well as a separate table for selected phases on the lower right-hand side. In addition, it is now possible to display multiple experimental diffraction patterns on top of each other, as you can see on the upper left-hand side.

Here is a list of the most outstanding improvements (click on the bold titles for more detailed information as well as more pictures):

• Runs on Mac, Linux and of course Windows
  No matter which one of these operating systems you prefer, Match! will run on it. Of course, you can use document files created with Match! on one platform on any other platform as well.
• Display and compare multiple diffraction patterns
  Additional experimental patterns can now be imported and displayed on top of each other, so that you can compare them to the main experimental pattern.
• Directly view specific phases/entries
  You already know that a certain phase is present in the sample, or you would like to check how some compound compares to the experimental diffraction pattern? That's pretty easy with the new version!
• Instant usage of additional information
  Additional information about the sample like elements that may be or must not be present, the density etc. can now be applied much easier than in the previous version.
• Saving of selection criteria
  Once you have entered a set of selection criteria (e.g. elements, density etc.) that best suits your requirements, you can save it using an appropriate name, and recall it later on with just two mouse clicks.
• Comfortable definition of background
  Simply insert, shift or delete control points in the automatically calculated background curve using the mouse, in order to precisely define the background with regard to the raw data.
• Improved zooming facilities
  Zoom now also implies zooming on the intensity (and not only on 2theta) axis. In addition, you can now simply use the mouse pointer and wheel to zoom into the area of interest. Of course, it is also possible to zoom to an exactly defined area (2theta/intensity).
• Batch Processing and Automatics
  You are a beginner or an expert user? As you like it: Simply adjust your skill level, in order to either give you full control at each single step, let Match! run the complete phase identification automatically, or anything in between.
• Rietveld refinement using FullProf (not yet in very first version 2.0)
  With just two mouse clicks, you can easily transfer your data (e.g. resulting from a phase identification) to the FullProf software and run a Rietveld refinement.
  This feature will most probably not be present yet in the very first version 2.0 but in a later version 2.x.

Customers who purchased (or will purchase) the current version after August 1, 2010 will be entitled to update to version 2 free-of-charge (only shipping costs must be paid if required). Customers who already use the current version will be offered an update to the new version at significantly reduced price. Changes and bug fixes to be made in version 2.x will be free-of-charge for customers who purchase version 2.0 or higher.