Crystal Impact Home  
  About us Diamond Endeavour Match! Pearson's CD  
About Match! 2
What's new...
Brochure...
Get Match! 2

Beta Version

Evaluate the new Match! version 2 with a time-limited beta version free-of-charge.
Support
Updates
Report a bug

Version 2: Improved Zooming Facilities

Go to Match! 2 Features Overview...
Previous: Comfortable definition of background...
Next: Batch Processing and Automatics...

With the previous version 1 of Match!, zooming was easy: Simply select a 2theta range you would like to investigate more into detail, and the software would reduce the diffraction pattern to the corresponding 2theta range and adapt the intensity axis accordingly. Well, this was simple, but not too flexible in fact...

With the new version 2, things have improved a lot: Like in the previous version, you can simply select a certain area in the diffraction pattern graphics using the mouse, and Match! will adapt the graphics accordingly. However, the first big difference is that now not only the 2theta range but also the range on the intensity axis can be selected. In other words, you can draw a rectangle inside your diffraction pattern using the mouse, and Match! will focus on this area.

Another option that is now available is to use the mouse wheel for zooming: Move the mouse cursor to the region in the diffraction pattern you would like to focus on, and turn the mouse wheel to focus right into this area (or out again, if you turn the mouse wheel into the opposite direction).

Once you have zoomed into the diffraction pattern, you can shift the pattern by keeping the 'Shift' button pressed on your keyboard while moving the mouse around. As an alternative, you can also keep the center mouse button (or mouse wheel) pressed while moving the mouse.

Finally, it is now also possible to exactly define the area (intensity and 2theta) you would like to display. A corresponding dialog is now provided for this purpose.

Go to Match! 2 Features Overview...
Previous: Comfortable definition of background...
Next: Batch Processing and Automatics...