Match! Update Page

Latest Update

The most recent version is 4.0 (Build 295) released on April 12, 2024.

If you are still using an earlier version and your update permission time has not expired yet (which can both be checked by selecting "About Match!" from the "Help" menu), we strongly recommend to update to the current version. This can easily be achieved by performing the following steps:

1. If Match! is running, please save any open documents and close the program.
2. Please DO NOT uninstall the previous version before installing the new version! Instead, simply install the new version on top of the existing version. This is important to make sure that your license file is retained.
3. Download the installer file for your platform (Windows, macOS, Linux) from the Download page, and uncompress ("unzip") it if necessary.
4. Make sure that you have administrator privileges on multi-user systems, then run the installer by double-clicking on it. More details about this topic are given in the platform-specific "Readme" files that are also available from the Download page.
5. Follow the steps in the installer until it has finished, then restart Match!.
6. Check whether the update was successful by selecting "About Match!" from the "Help" menu.

Enhancements in version 4.0 (Build 295)

• Profile-fitting search-match (PFSM) is now available, as an alternative to the classical search-match based on peak data. PFSM tries to fit the profile calculated from every candidate entry in the reference database to your experimental diffraction pattern. PFSM can be run using the new menu command "Search / Search-match using profile fitting".
• Improved handling of entries without I/Ic value in quantitative RIR analysis, e.g. when using the ICDD PDF-2 database: Missing I/Ic values in the match list can now be calculated from imported crystal structure data (CIF) or entered manually.
• New menu command "Quantify / Rietveld refinement (FullProf)" uses the currently selected schedule (-> Rietveld options) to perform an automatic Rietveld refinement calculation for quantitative analysis.
• New "Quantitative analysis" options "Show quantitative analysis method in pie chart graphics title" and "Automatically switch over to the pie chart graphics after performing a quantitative analysis"
• New menu command "Entries / Automatic entry selection" selects matching phases automatically. The minimum required Rwp reduction (that is also used for automatic selection of entries) can be adjusted in the "PF search-match" section on the "Search-Match" tab of the "Options" window.
• New menu command "Edit / Copy candidate list" copies the current contents of the candidate list at the bottom left into the clipboard, in order to insert it into some other program (e.g. Microsoft Excel).
• New menu command "Edit / Copy match list" copies the current contents of the match list (phases selected as 'matching') at the bottom right into the clipboard, in order to insert it into some other program (e.g. Microsoft Excel).
• Continuous display of already found results during normal (peak-based) search-match
• For macOS there now are separate versions for ARM (Apple Silicon) and Intel processors. This significantly increases the calculation speed on Apple Silicon while at the same time reducing the memory overhead.
• Demo version has new signature, so that the Match! 4 demo version can be run for 60 days even if the Match! 3 demo version has expired.
• An issue causing background control points to be no longer shiftable or removable once they got too close to each other has been resolved.
• A bug affecting the recalculation of the degree-of-crystallinity (DOC) has been fixed.
• Another bug sometimes affecting the peak position accuracy in peak searching has been resolved.
• There was a bug affecting the "1/d"-scaling of the x-axis in the pattern graphics that has been fixed by now.